Visualizing Intrinsic 3D‐Strain Distribution in Gold Coated ZnO Microstructures by Bragg Coherent X‐Ray Diffraction Imaging and Transmission Electron Microscopy with Respect to Piezotronic Applications

Novel devices ranging from bio magnetic field sensors to energy harvesting nano machines utilize the piezotronic effect. For optimal function, understanding interaction of electrical and strain phenomena within semiconductor crystal is necessary. Here, studies a model system are presented, consisting ZnO microrod coated by thin layer gold, which forms Schottky contact with piezoelectric material. Coherent X-ray diffraction imaging (CXDI) transmission electron microscopy (TEM) used visualize structure distribution, showing that exhibits strains multiple origins in bulk at interface. Strain values −6 × 10-4 have been measured CXDI ZnO/Au The origin shown be combination an interface strain, possibly caused formation, distinct, localized fields inside assigned depletion screening bent rod. These findings will contribute sensor development better applications.